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Lecturer(s)
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Kubínek Roman, doc. RNDr. CSc.
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Course content
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Scanning tunneling microscopy (STM) Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes MFM - Magnetic force microscopy LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques SPM as a surface analytical tool Environment of SPM methods Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips The artifacts of the images Tip convolution effect Feedback artifacts Possibilities of computer image analysis, testing of artifacts Applications of SPM
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Learning activities and teaching methods
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Lecture
- Attendace
- 36 hours per semester
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Learning outcomes
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Scanning tunneling microscopy (STM), AFM,l MFM, LFM, SPM, aplications. <li> Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes <li> MFM - Magnetic force microscopy <li> LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques <li> SPM as a surface analytical tool <li> Environment of SPM methods <li> Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips <li> The artifacts of the images <li> Tip convolution effect <li> Feedback artifacts <li> Possibilities of computer image analysis, testing of artifacts <li> Applications of SPM </ul>
The cource is based on abilities to theoretical and practical use of experimental methods. Evaluate the particular methods and principles, explain the aspects and results concerning the given issue, integrate the knowledge, predict the solutions, evaluate the results and outcomes.
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Prerequisites
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Experimental Physics lectures
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Assessment methods and criteria
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Mark, Seminar Work
Knowledge within the scope of the course topics (examination)
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Recommended literature
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http://atmilab.upol.cz/brozura.html - e-verze učebního textu.
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Bonnel, D. (2001). Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications. Wiley.
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Kubínek, R.-Mašláň, M.-Vůjtek, M. (2003). Mikroskopie skenující sondou. UP Olomouc.
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Meyer E., Hug H. J., Bennewitz R. (2004). Scanning Probe Microscopy: The Lab on a Tip by.. Springer Verlag, Berlin, Heidelberg, New York.
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Vůjtek, M., Kubínek, R., & Mašláň, M. (2012). Nanoskopie. V Olomouci: Univerzita Palackého.
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