Course: Thin Films

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Course title Thin Films
Course code SLO/TVY
Organizational form of instruction Lecture
Level of course Bachelor
Year of study not specified
Semester Winter
Number of ECTS credits 4
Language of instruction Czech
Status of course unspecified
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Křepelka Jaromír, Ing. CSc.
Course content
Properties of thin layers, methods of production of thin layers and their inspections. Propagation of electromagnetic field in isotropic non-homogeneous medium, solution of wave equation in homogeneous isotropic medium, matrix description of systems of thin layers, transformation of the field and transfer of energy in systems of thin layers, principle of reversibility. Examples: interface of two media, one thin layer, one thick layer, systems of thin and thick layers, layer in partially coherent light, field inside the system of thin layers, symmetrical systems, periodic structures, antireflective structures, MacNeill polarizer, Fabry-Perot filter. Basics of evaluation of ellipsometric measurement. Anisotropic layered media.

Learning activities and teaching methods
Lecture
  • Homework for Teaching - 30 hours per semester
  • Attendace - 26 hours per semester
  • Preparation for the Exam - 64 hours per semester
Learning outcomes
The aim is to familiarize students with the basic optical characteristics of systems composed from thin isotropic, homogeneous (and inhomogeneos) layers designed from dielectric and also metal materials including their applications. The attention is also paid to the propertiesof ideal thick layers and their combinations with thin film systems, and anisotropic layers too. The theory is based on the solution of Maxwell equations for plane waves, from which the formulae for transformation of tangential components of electric and magnetic field are derived and measurable macroscopic parameters (reflectivity, transparency, absorbtion) are defined. There are discussed theoretically interesting problems, for instance the reversibility principle, principle of equivalence for symetrical system of layers, the thin film behaviour in partly coherent light field, colour effects within thin films, the relation of thin films to the wave guided structures and the relation of periodical structures to photonic crystals. The examples of practical design problems are solved especially using anisotropic structures, highly reflecting systems, narrow band filters and polarising beam splitters.
Knowledge Recall propagation of electromagnetic waves in layered systems, identify measurable parameters of thin and/or thick films, describe a design of basic layered systems for interference filters using the analytical and numerical approach.
Prerequisites
Prior requirements are supposed from basic courses of mathematical analysis, algebra and classsical theory of electromagnetic field.

Assessment methods and criteria
Oral exam

Understanding of physical principles beyond the optics of thin films, ability to design basic thin film systems using analytical results and eventually numerical codes.
Recommended literature
  • Baumeister, W. P. (2004). Optical coating technology. SPIE.
  • Born M., Wolf E. (1968). Principles of Optics. Pergamon Press Oxford.
  • Eckertová L. (1974). Fyzika tenkých vrstev. SNTL, Praha.
  • Kaiser, N., Pulker, H. K. (Eds.). (2003). Optical interference coatings. Springer.
  • Knittl Z. (1976). Optics of thin films. John Wiley & Sons, London, New York, Sydney, Toronto.
  • Křepelka J. (1993). Optika tenkých vrstev. Přírodovědecká fakulta, Olomouc.
  • MacLeod H. A. (2020). Thin-film optical filters. Taylor Francis Group.
  • Stratton J. A. (1941). Electromagnetic theory. McGraw-Hill, New York.
  • Vašíček, A. (1957). Měření a vytváření tenkých vrstev v optice. NČSAV, Praha.
  • Vašíček, A. (1956). Optika tenkých vrstev. NČSAV, Praha.
  • Yeh, P. (2005). Optical waves in layered media. Wiley.


Study plans that include the course
Faculty Study plan (Version) Category of Branch/Specialization Recommended year of study Recommended semester