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Lecturer(s)
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Berka Karel, doc. RNDr. Ph.D.
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Panáček Aleš, doc. RNDr. Ph.D.
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Filip Jan, Mgr. Ph.D.
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Course content
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1. Introduction to generation of X-rays, nature of X-rays, modification of X-ray beam with respect to its use in instrumental analytical techniques, basics of radiation safety. 2. X-ray diffraction on periodic atomic structure, basic overview of crystallography, basics of single-crystal X-ray diffraction, X-ray powder diffraction - theory, instrumentation, sample preparation, evaluation of diffraction patterns, quantitative phase analysis, Rietveld refinement, specifics of nanostructure analysis, high-temperature/low-temperature X-ray diffraction, thin-film analysis, relations to electron and neutron diffraction. 3. Small-angle X-ray scattering (SAXS) - theory, instrumentation for inorganic and biological samples, standardization, sample preparation, data evaluation and processing. 4. X-ray fluorescent spectroscopy - theory, instrumentation (energy-dispersive, wavelength-dispersive spectrometers), standardization, sample preparation, evaluation of spectra, other applications of fluorescent spectroscopy (microanalysis, portable spectrometers etc.). 5. X-ray photoelectron and Auger electron spectroscopy - theory, basic overview of surface analysis, instrumentation, sample preparation, evaluation of spectra, angle-resolved X-ray photoelectron spectroscopy, depth profiling. 6. X-ray absorption spectroscopy - theory, instrumentation and modes of measurement (XANES, EXAFS), sample preparation, standardization, evaluation of spectra.
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Learning activities and teaching methods
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Monologic Lecture(Interpretation, Training), Demonstration, Laboratory Work
- Homework for Teaching
- 20 hours per semester
- Preparation for the Exam
- 40 hours per semester
- Attendace
- 26 hours per semester
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Learning outcomes
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The aim of the lecture is to transfer to the students the knowledge concening X-ray based methods (diffraction and spectroscopy) and their application for characterization of (nano)materials.
Define basic terms in the field of X-ray based instrumental methods, describe main approaches when applying the X-ray methods for characterization of (nano)materials, demonstrate the understanding of various issues and apply the acquired knowledge for solution of model problems.
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Prerequisites
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unspecified
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Assessment methods and criteria
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Dialog
Class attendance. Knowledge of the course topics, ability to discuss about the course topics in wider contexts.
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Recommended literature
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Cahn, R.W., Haasen, P. & Kramer, J. (Eds.). (2005). Materials science and technology, a comprehensive treatment. Vol. 2a/2b: Characterization of materials. - WILEY-VCH Verlag GmbH & Co. KGaA (2005).
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Clearfield, A., Reibenspies, J.H. & Bhuvanesh, N. (Eds.). (2008). Principles and Applications of Powder Diffraction. Blackwell Publishing Ltd.
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Hofmann, S. (2013). Auger- and X-ray Photoelectron Spectroscopy in Material Science. Springer Series in Surface Sciences 49, Springer-Verlag Berlin, Heidelberg.
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Pecharsky, V.K. & Zavalij, P.I. (2009). Fundamentals of Powder Diffraction and Structural Characterization of Materials. Springer Science+Business Media, LLC.
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