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Lecturer(s)
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Kubínek Roman, doc. RNDr. CSc.
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Course content
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Phase contrast in light microscopy UV and IR microscopy, fluorescent microscopy, polarization microscopy, interference microscopy (Nomarski interference contrast, Hofman modulation contrast) Laser confocal microscopy Near field scanning optical microscopy Transmission electron microscopy Low-voltage electron microscopy High-resolution electron microscopy Environmental electron microscopy (biological applications) Scanning tunneling microscopy Atomic force microscopy Magnetic force microscopy Electrostatic force microscopy Lateral force microscopy Scanning capacitance microscopy
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Learning activities and teaching methods
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Lecture
- Attendace
- 36 hours per semester
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Learning outcomes
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Light microscopy. Electron microscopy. Scanning tunneling microscopy
Ability of understanding of physical principles advanced microscopic methods. Evaluate the particular methods and principles, explain the aspects and results concerning the given issue, integrate the knowledge, predict the solutions, evaluate the results and outcomes.
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Prerequisites
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The student has physical knowledge from the basic course of physics, especially optics and electricity and magnetism. Student can integrate basic knowledge of physics in optical and optoelectronic devices such as light and electron microscope.
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Assessment methods and criteria
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Mark, Seminar Work
Knowledge within the scope of the course topics (examination)
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Recommended literature
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Douglas B. Murphy. (2001). Fundamentals of Ligt Microscopy and Electronic Imagin. Wiley-Liss.
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Kubínek, R., Mašláň, M., Vůjtek, M. (2002). Mikroskopie skenující sondou. UP Olomouc.
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Reimer, L. (1998). Scanning Electron Microscopy.Physics of Image Formation and Microanalysis.. Springer.
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Vůjtek, M., Kubínek, R., & Mašláň, M. (2012). Nanoskopie. V Olomouci: Univerzita Palackého.
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