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Lecturer(s)
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Course content
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1. Measurement methods, measurement principles, dividing of methods, charakterization of individual types. 2. Measuring instruments, measurement standards, reference materials. 3. Measuring devices, propertis, calibration and confirmation, metrological traceability. 4. Physical and technical quantities and units, types of quantities, definition and divideng of quantities according the set of standards ?SN ISO 80000, OR ?SN ISO 31, respectivelly. 5. Systems of units, international system of units, its evolution and future development. 6. Basic and derived units of SI, dekadic multiples and submultiples, definition and meaning. 7. Internation vocabulary in metrology (VIM), definition of terms in metrology, their meaning, english equivalnts,
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Learning activities and teaching methods
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Lecture, Work with Text (with Book, Textbook)
- Attendace
- 26 hours per semester
- Homework for Teaching
- 14 hours per semester
- Preparation for the Exam
- 20 hours per semester
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Learning outcomes
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The point is explanation of general principles of methrology, common to all measurement branches, such as physical and technical quantities and units, their systems, measurement devices and systems, etalons, methrological terminology and others.
1 knowledge List the scope of general metrology. Recall and define fundamental terms of metrology. Describe fields of activity of general metrology.
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Prerequisites
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unspecified
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Assessment methods and criteria
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Oral exam, Written exam
Attendance the lectures. Knowledge of presented problems at exam.
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Recommended literature
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Prezentace přednášek.
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řada norem ČSN ISO 31 (pouze platné části, nenahrazené normami ČSN ISO 80000)..
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řada norem ČSN ISO 80000, Veličiny a jednotky..
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TNI 01 0115, Mezinárodní metrologický slovník - Základní a všeobecné pojmy a přidružené termíny (VIM).
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Vyhláška 264/2000 Sb. o základních měřicích jednotkách a ostatních jednotkách.
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Zákon č.505/1990 Sb. ve znění pozdějších předpisů..
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Zápisy z přednášek.
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Kraus J. a kol. (2000). Komentář k novele zákona č.505/1990 Sb.. TECH-MARKET, Praha.
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Šindelár J. a kol. (1994). Základy obecné metrologie. Edice Základy metrológie, svazek 6. Praha, SNTL.
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