Course: X-Ray Structural Analysis

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Course title X-Ray Structural Analysis
Course code AFC/PGSXR
Organizational form of instruction Lecture
Level of course Doctoral
Year of study not specified
Semester Winter and summer
Number of ECTS credits 20
Language of instruction Czech, English
Status of course unspecified
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Nemec Ivan, Ing. Ph.D.
Course content
Factors influencing the diffraction intensity. Types of scan. Classification of diffractometers. Modern trends in X-ray technique (synchrotron sources, CCD detectors, imaging plates, computing chains). Low temperature measurements; neutron diffraction. Internet and crystallography, software, databases.

Learning activities and teaching methods
Lecture
Learning outcomes
The course introduces students to basic concepts of crystallochemistry and X-ray analysis.
Recall X-ray diffraction analysis - theory, methods, new approaches, applications.
Prerequisites
unspecified

Assessment methods and criteria
Oral exam

Recommended literature
  • (1998). Crystallographic Instrumentation by L. A. Aslanov, G. V. Fetisov and J. A. K. Howard. Edited by J.A.K Howard, International Union of Crystallography, Oxford University Press.
  • (1983). International Tables for Crystallography. Reidel Publishing Company, Dordrecht, Boston.
  • Manuály k programovým balíkům. (k dispozici v elektronické podobě).
  • Giazovazzo, C. et al. (1994). Fundamentals of Crystallography. Oxford Science Publications, IUCr.
  • Glusker, J. P., Lewis, M. & Rossi, M. (1994). Crystal Structure Analysis for Chemists and Biologists. VCH Publishers, New York.
  • Luger, P. (1980). Modern X-ray analysis of single crystals. W. de Gruyter, Berlin-New York.


Study plans that include the course
Faculty Study plan (Version) Category of Branch/Specialization Recommended year of study Recommended semester